Authors:
van Leeuwen, TN
Moed, HF
Tijssen, RJW
Visser, MS
van Raan, AFJ
Citation: Tn. Van Leeuwen et al., Language biases in the coverage of the Science Citation Index and its consequences for international comparisons of national research performance, SCIENTOMETR, 51(1), 2001, pp. 335-346
Citation: Rjw. Tijssen, Global and domestic utilization of industrial relevant science: patent citation analysis of science-technology interactions and knowledge flows, RES POLICY, 30(1), 2001, pp. 35-54
Authors:
van Leeuwen, TN
Moed, HF
Tijssen, RJW
Visser, MS
van Raan, AFJ
Citation: Tn. Van Leeuwen et al., First evidence of serious language-bias in the use of citation analysis for the evaluation of national science systems, RES EVALUAT, 9(2), 2000, pp. 155-156
Citation: Rjw. Tijssen et al., Technological relevance of science: An assessment of citation linkages between patents and research papers, SCIENTOMETR, 47(2), 2000, pp. 389-412
Citation: Rjw. Tijssen et E. Van Wijk, In search of the European Paradox: an international comparison of Europe'sscientific performance and knowledge flows in information and communication technologies research, RES POLICY, 28(5), 1999, pp. 519-543