Authors: Tofuku, A Yoshie, T Osaka, T Koiwa, I Kobayashi, H Sawada, Y Hashimoto, A

Citation: A. Tofuku et al., Analysis of the degradation mechanism of Pt/SrBi2(Ta/Nb)(2)O-9/Pt capacitors during reductive annealing, INTEGR FERR, 25(1-4), 1999, pp. 585-604