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Citation: M. Toivakka et K. Nyfors, Pare space characterization of coating layers, TAPPI J, 84(3), 2001, pp. 49-49

Authors: Toivakka, M Kokko, A Salminen, P Urscheler, R Bousfield, DW

Citation: M. Toivakka et al., Leveling of surface defects in thin films of pigmented coatings, NORD PULP P, 16(3), 2001, pp. 246-250

Authors: Toivakka, M

Citation: M. Toivakka, A simulation model to predict coating coverage, PAP PUU, 83(1), 2001, pp. 34-41