Authors: da Cruz, NC Rangel, EC Tabacknics, MH Trasferetti, BC Davanzo, CU

Citation: Nc. Da Cruz et al., The effect of ion bombardment on the properties of TiOx films deposited bya modified ion-assisted PECVD technique, NUCL INST B, 175, 2001, pp. 721-725

Authors: Trasferetti, BC Davanzo, CU Zoppi, RA da Cruz, NC de Moraes, MAB

Citation: Bc. Trasferetti et al., Berreman effect applied to phase characterization of thin films supported on metallic substrates: The case of TiO2 - art. no. 125404, PHYS REV B, 6412(12), 2001, pp. 5404

Authors: da Cruz, NC Rangel, EC Wang, JJ Trasferetti, BC Davanzo, CU Castro, SGC de Moraes, MAB

Citation: Nc. Da Cruz et al., Properties of titanium oxide films obtained by PECVD, SURF COAT, 126(2-3), 2000, pp. 123-130

Authors: Trasferetti, BC Davanzo, CU Da Cruz, NC De Moraes, MAB

Citation: Bc. Trasferetti et al., Observation of the Berreman effect in infrared reflection-absorption spectra of amorphous titanium oxide thin films deposited on aluminum, APPL SPECTR, 54(5), 2000, pp. 687-691

Authors: Trasferetti, BC Davanzo, CU

Citation: Bc. Trasferetti et Cu. Davanzo, s- and p-polarized infrared specular reflectance of vitreous silica at oblique incidences: Detection of LO modes, APPL SPECTR, 54(4), 2000, pp. 502-507