Authors:
Iester, M
Traverso, CE
Capris, P
Vittone, P
Zingirian, M
Citation: M. Iester et al., Different value scales between frequency-doubling technique and standard threshold perimetry, ACT OPHTH S, 78, 2000, pp. 26-27
Authors:
Iester, M
Altieri, M
Capris, P
Zingirian, M
Traverso, CE
Citation: M. Iester et al., Comparison between relative dispersion analysis of high-pass resolution perimetry and standard threshold perimetry, EYE, 14, 2000, pp. 742-746
Authors:
Iester, M
Capris, P
Pandolfo, A
Zingirian, M
Traverso, CE
Citation: M. Iester et al., Learning effect, short-term fluctuation, and long-term fluctuation in frequency doubling technique, AM J OPHTH, 130(2), 2000, pp. 160-164