Authors:
Bright, AN
Tricker, DM
Humphreys, CJ
Davies, R
Citation: An. Bright et al., A transmission electron microscopy study of microstructure evolution with increasing anneal temperature in Ti/Al ohmic contacts to n-GaN, J ELEC MAT, 30(3), 2001, pp. L13-L16
Authors:
Bright, AN
Thomas, PJ
Weyland, M
Tricker, DM
Humphreys, CJ
Davies, R
Citation: An. Bright et al., Correlation of contact resistance with microstructure for Au/Ni/Al/Ti/AlGaN/GaN ohmic contacts using transmission electron microscopy, J APPL PHYS, 89(6), 2001, pp. 3143-3150
Citation: Dm. Tricker et al., Characterisation of epitaxial laterally overgrown gallium nitride using transmission electron microscopy, PHYS ST S-B, 216(1), 1999, pp. 633-637