Authors:
Soriano, L
Fuentes, GG
Quiros, C
Trigo, JF
Sanz, JM
Bressler, PR
Gonzalez-Elipe, AR
Citation: L. Soriano et al., Crystal-field effects at the TiO2-SiO2 interface as observed by X-ray absorption spectroscopy, LANGMUIR, 16(17), 2000, pp. 7066-7069
Authors:
Ramiro, J
Perea, A
Trigo, JF
Laaziz, Y
Camarero, EG
Citation: J. Ramiro et al., Pulsed laser deposition and electrodeposition techniques in growing CdTe and CdxHg1-xTe thin films, THIN SOL FI, 361, 2000, pp. 65-69
Authors:
Fuentes, GG
Mancheno, IG
Balbas, F
Quiros, C
Trigo, JF
Yubero, F
Elizalde, E
Sanz, JM
Citation: Gg. Fuentes et al., Dielectric properties of Ti, TiO2 and TiN from 1.5 to 60 eV determined by reflection electron energy loss spectroscopy (REELS) and ellipsometry, PHYS ST S-A, 175(1), 1999, pp. 429-436