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Results:
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Results: 1
Metallic thin film thickness determination using electron probe microanalysis
Authors:
Campos, CS Coleoni, EA Trincavelli, JC Kaschny, J Hubbler, R Soares, MRF Vasconcellos, MAZ
Citation:
Cs. Campos et al., Metallic thin film thickness determination using electron probe microanalysis, X-RAY SPECT, 30(4), 2001, pp. 253-259
Risultati:
1-1
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