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Results: 1-4 |
Results: 4
Hydrogen passivation in plasma-etched polycrystalline silicon resistors
Authors: Tringe, JW Deal, MD Plummer, JD
Citation: Jw. Tringe et al., Hydrogen passivation in plasma-etched polycrystalline silicon resistors, EL SOLID ST, 3(11), 2000, pp. 517-519
A diffraction-based transmission electron microscope technique for measuring average grain size
Authors: Tringe, JW Deal, MD Plummer, JD
Citation: Jw. Tringe et al., A diffraction-based transmission electron microscope technique for measuring average grain size, EL SOLID ST, 3(11), 2000, pp. 520-523
Electrical and structural properties of polycrystalline silicon
Authors: Tringe, JW Plummer, JD
Citation: Jw. Tringe et Jd. Plummer, Electrical and structural properties of polycrystalline silicon, J APPL PHYS, 87(11), 2000, pp. 7913-7926
Transparent probe test structure for electrical and physical characterization of defects in thin films
Authors: Tringe, JW Deal, MD Plummer, JD
Citation: Jw. Tringe et al., Transparent probe test structure for electrical and physical characterization of defects in thin films, J ELCHEM SO, 147(12), 2000, pp. 4633-4638
Risultati: 1-4 |