Authors: Trivedi, VP Hsu, CH Luo, B Cao, X LoRache, JR Ren, F Pearton, SJ Abernathy, CR Lambers, E Hoppe, M Wu, CS Sasserath, J Lee, JW Mackenzie, K

Citation: Vp. Trivedi et al., The effect of N-2 plasma damage on AlGaAs/InGaAs/GaAs high electron mobility transistors. I. DC characteristics, SOL ST ELEC, 44(12), 2000, pp. 2101-2108