Authors: Tsai, JWH Chan, SW Kirtley, JR Tidrow, SC Jiang, Q

Citation: Jwh. Tsai et al., The variation of J(cgb) with GB misorientation and inclination measured using the scanning SQUID microscope, IEEE APPL S, 11(1), 2001, pp. 3880-3883

Authors: Tsai, JWH Ling, S Rodriguez, JC Mustapha, Z Chan, SW

Citation: Jwh. Tsai et al., Grain growth simulation of [001] textured YBCO films grown on (001) substrates with large lattice misfit: Prediction of misorientations of the remaining boundaries, J ELEC MAT, 30(4), 2001, pp. 422-431

Authors: Tsai, JWH Nathanson, M Kimball, R Geiss, R Logan, T Nguyen, T

Citation: Jwh. Tsai et al., Non-destructive defect detection scheme using Kerr-Channel Optical SurfaceAnalyzer, IEEE MAGNET, 37(4), 2001, pp. 1957-1959