Authors: Lii, DF Huang, JL Tsai, WK Lo, WT Yau, BS

Citation: Df. Lii et al., Investigation of Ti1-xAlxN films as diffusion barrier between Cu and Si, SURF ENG, 17(4), 2001, pp. 295-299

Authors: Tsai, WK Antonio, JK Huang, GM

Citation: Wk. Tsai et al., Complexity of gradient projection method for optimal routing in data networks, IEEE ACM TN, 7(6), 1999, pp. 897-905