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Results: 1-7 |
Results: 7
Why hot carrier emission based timing probes will work for 50 nm, 1V CMOS technologies
Authors: Tsang, JC Fischetti, MV
Citation: Jc. Tsang et Mv. Fischetti, Why hot carrier emission based timing probes will work for 50 nm, 1V CMOS technologies, MICROEL REL, 41(9-10), 2001, pp. 1465-1470
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis
Authors: Mc Manus, MK Kash, JA Steen, SE Polonsky, S Tsang, JC Knebel, DR Huott, W
Citation: Mk. Mc Manus et al., PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis, MICROEL REL, 40(8-10), 2000, pp. 1353-1358
Watching chips work: picosecond hot electron light emission from integrated circuits
Authors: Kash, JA Tsang, JC
Citation: Ja. Kash et Jc. Tsang, Watching chips work: picosecond hot electron light emission from integrated circuits, J CRYST GR, 210(1-3), 2000, pp. 318-322
Time-resolved optical characterization of electrical activity in integrated circuits
Authors: Tsang, JC Kash, JA Vallett, DP
Citation: Jc. Tsang et al., Time-resolved optical characterization of electrical activity in integrated circuits, P IEEE, 88(9), 2000, pp. 1440-1459
Picosecond imaging circuit analysis
Authors: Tsang, JC Kash, JA Vallett, DP
Citation: Jc. Tsang et al., Picosecond imaging circuit analysis, IBM J RES, 44(4), 2000, pp. 583-603
Hemolytic anemia after atrioventricular septal defect repair without synthetic material
Authors: Tsang, JC Shum-Tim, D Tchervenkov, CI Jutras, L Sinclair, B
Citation: Jc. Tsang et al., Hemolytic anemia after atrioventricular septal defect repair without synthetic material, ANN THORAC, 68(5), 1999, pp. 1838-1840
The Vineberg procedure in the era of transmyocardial revascularization - Anew paradigm for an old operation
Authors: Tsang, JC Li, CM Chiu, RCJ
Citation: Jc. Tsang et al., The Vineberg procedure in the era of transmyocardial revascularization - Anew paradigm for an old operation, DEV CARD M, 211, 1999, pp. 17-43
Risultati: 1-7 |