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Results:
1-8
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Results: 8
Authors:
Tsu, IF
Wang, JL
Babcock, SE
Polyanskii, AA
Larbalestier, DC
Sickafus, KE
Citation: If. Tsu et al., Structure and properties of an intragranular weak link in Bi2Sr2CaCu2O8+x single crystals, PHYSICA C, 349(1-2), 2001, pp. 8-18
Authors:
Bae, S
Judy, JH
Tsu, IF
Murdock, ES
Citation: S. Bae et al., Electromigration-induced failure of single layered NiFe Permalloy thin films for a giant magnetoresistive read head, J APPL PHYS, 90(5), 2001, pp. 2427-2432
Authors:
Huang, RT
Chen, FR
Kai, JJ
Tsu, IF
Mao, S
Kai, W
Citation: Rt. Huang et al., Diffusion behavior of the spin valve structure, J APPL PHYS, 89(11), 2001, pp. 7625-7627
Authors:
Tsu, IF
Burg, GA
Wood, WP
Citation: If. Tsu et al., Degradation of spin valve heads under accelerated stress conditions, IEEE MAGNET, 37(4), 2001, pp. 1707-1709
Authors:
Ladwig, PF
Tsu, IF
Chang, CH
Chang, YA
Citation: Pf. Ladwig et al., Thermal modeling of magnetoresistive heads in three dimensions, IEEE MAGNET, 37(3), 2001, pp. 1132-1136
Authors:
Bae, S
Judy, JH
Tsu, IF
Davis, M
Murdock, ES
Citation: S. Bae et al., Dependence of electromigration-induced failure lifetimes on NiFe thin-filmthickness in giant magnetoresistive spin-valve read heads, APPL PHYS L, 79(22), 2001, pp. 3657-3659
Authors:
Tsu, IF
Morrone, A
Huang, RT
Chen, FR
Citation: If. Tsu et al., Contact-dependent reliability of spin valve heads, IEEE MAGNET, 36(5), 2000, pp. 2602-2604
Authors:
Tsu, IF
Duxstad, KJ
Citation: If. Tsu et Kj. Duxstad, Thermal reliability of NiMn-based spin valves, J APPL PHYS, 85(8), 1999, pp. 5858-5860
Risultati:
1-8
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