Authors:
Unguris, J
Tulchinsky, D
Kelley, MH
Borchers, JA
Dura, JA
Majkrzak, CF
Hsu, SY
Loloee, R
Pratt, WP
Bass, J
Citation: J. Unguris et al., Magnetic depth profiling Co/Cu multilayers to investigate magnetoresistance (invited), J APPL PHYS, 87(9), 2000, pp. 6639-6643