AAAAAA

   
Results: 1-11 |
Results: 11
IN-SITU AFTER-TREATMENT USING LOW-ENERGY DRY-ETCHING WITH A CF4 O-2 GAS-MIXTURE TO REMOVE REACTIVE ION ETCHING DAMAGE/
Authors: MATSUI M UCHIDA F KOJIMA M TOKUNAGA T YAMAZAKI K KATSUYAMA K ARAI H
Citation: M. Matsui et al., IN-SITU AFTER-TREATMENT USING LOW-ENERGY DRY-ETCHING WITH A CF4 O-2 GAS-MIXTURE TO REMOVE REACTIVE ION ETCHING DAMAGE/, JPN J A P 1, 37(4B), 1998, pp. 2330-2336
LOW-ENERGY ION-SCATTERING MEASUREMENT OF NEAR-SURFACE DAMAGE-INDUCED BY THE SIO2 DRY-ETCHING PROCESS
Authors: MATSUI M UCHIDA F KATSUYAMA K TOKUNAGA T KOJIMA M
Citation: M. Matsui et al., LOW-ENERGY ION-SCATTERING MEASUREMENT OF NEAR-SURFACE DAMAGE-INDUCED BY THE SIO2 DRY-ETCHING PROCESS, JPN J A P 1, 37(4A), 1998, pp. 2043-2050
ELECTROPHYSIOLOGICAL CHARACTERISTICS DURING SLOW PATHWAY ABLATION OF POSTERIOR ATRIOVENTRICULAR JUNCTIONAL REENTRANT TACHYCARDIA
Authors: FUJII E KASAI A OMICHI C TERAMURA S YASUDA M UCHIDA F NAKANO T
Citation: E. Fujii et al., ELECTROPHYSIOLOGICAL CHARACTERISTICS DURING SLOW PATHWAY ABLATION OF POSTERIOR ATRIOVENTRICULAR JUNCTIONAL REENTRANT TACHYCARDIA, PACE, 21(11), 1998, pp. 2510-2516
EFFECT OF RADIOFREQUENCY CATHETER ABLATION ON PARASYMPATHETIC DENERVATION - A COMPARISON OF 3 DIFFERENT ABLATION SITES
Authors: UCHIDA F KASAI A OMICHI C FUJII E TERAMURA S YASUDA M NAKANO T
Citation: F. Uchida et al., EFFECT OF RADIOFREQUENCY CATHETER ABLATION ON PARASYMPATHETIC DENERVATION - A COMPARISON OF 3 DIFFERENT ABLATION SITES, PACE, 21(11), 1998, pp. 2517-2521
ON SMOOTH SO0(P,Q)-ACTIONS ON SP+Q-1 .2.
Authors: UCHIDA F
Citation: F. Uchida, ON SMOOTH SO0(P,Q)-ACTIONS ON SP+Q-1 .2., Tohoku Mathematical Journal, 49(2), 1997, pp. 185-202
IMPAIRED ENDOTHELIAL FUNCTION IN EPICARDIAL CORONARY-ARTERIES AFTER KAWASAKI-DISEASE
Authors: MITANI Y OKUDA Y SHIMPO H UCHIDA F HAMANAKA K AOKI K SAKURAI M
Citation: Y. Mitani et al., IMPAIRED ENDOTHELIAL FUNCTION IN EPICARDIAL CORONARY-ARTERIES AFTER KAWASAKI-DISEASE, Circulation, 96(2), 1997, pp. 454-461
IN-SITU MEASUREMENT OF HE-ENERGY ION-SCATTERING SPECTROSCOPY( STOPPING IN SI LAYERS BY LOW)
Authors: MATSUI M UCHIDA F NAKAGAWA K NISHIDA A
Citation: M. Matsui et al., IN-SITU MEASUREMENT OF HE-ENERGY ION-SCATTERING SPECTROSCOPY( STOPPING IN SI LAYERS BY LOW), JPN J A P 1, 35(3), 1996, pp. 1937-1939
PASSIVE COUPLING OF A SINGLE-MODE OPTICAL WAVE-GUIDE AND A LASER DIODE WAVEGUIDE PHOTODIODE FOR A WDM TRANSCEIVER MODULE/
Authors: TSUJI S TAKAHASHI R KATO T UCHIDA F KIKUCHI S HIRATAKA T SHISHIKURA M OKANO H SHIOTA T AOKI S
Citation: S. Tsuji et al., PASSIVE COUPLING OF A SINGLE-MODE OPTICAL WAVE-GUIDE AND A LASER DIODE WAVEGUIDE PHOTODIODE FOR A WDM TRANSCEIVER MODULE/, IEICE transactions on communications, E79B(7), 1996, pp. 943-945
MEASUREMENT OF SI(100) SURFACE-MORPHOLOGY BY LOW-ENERGY ION-SCATTERING SPECTROSCOPY
Authors: MATSUI M UCHIDA F NAKAGAWA K NISHIDA A
Citation: M. Matsui et al., MEASUREMENT OF SI(100) SURFACE-MORPHOLOGY BY LOW-ENERGY ION-SCATTERING SPECTROSCOPY, Surface science, 358(1-3), 1996, pp. 82-86
DARK-FIELD IMAGING IN HARD X-RAY-SCANNING MICROSCOPY
Authors: SUZUKI Y UCHIDA F
Citation: Y. Suzuki et F. Uchida, DARK-FIELD IMAGING IN HARD X-RAY-SCANNING MICROSCOPY, Review of scientific instruments, 66(2), 1995, pp. 1468-1470
NONDESTRUCTIVE IMAGING OF DEFECTS IN MBE-GROWN FILM WITH A SCANNING-X-RAY DIFFRACTION MICROSCOPE
Authors: UCHIDA F SUZUKI Y
Citation: F. Uchida et Y. Suzuki, NONDESTRUCTIVE IMAGING OF DEFECTS IN MBE-GROWN FILM WITH A SCANNING-X-RAY DIFFRACTION MICROSCOPE, Applied surface science, 70-1, 1993, pp. 273-277
Risultati: 1-11 |