Authors:
LAKNER H
UNGERECHTS S
BEHRES A
KOHL A
OPITZ B
HEIME K
WOITOK J
Citation: H. Lakner et al., CHARACTERIZATION OF MOVPE GROWN INGAASP SUPERLATTICES FOR MODULATORS BY ELECTRON-DIFFRACTION, X-RAY-DIFFRACTION AND Z-CONTRAST IMAGING, Journal of crystal growth, 170(1-4), 1997, pp. 732-737
Citation: H. Lakner et al., CHARACTERIZATION OF III-V SEMICONDUCTOR INTERFACES BY Z-CONTRAST IMAGING, EELS AND CBED, Journal of physics. D, Applied physics, 29(7), 1996, pp. 1767-1778