Authors:
Fujii, E
Kasai, A
Omichi, C
Matsuoka, K
Teramura, S
Uchida, F
Nakano, T
Citation: E. Fujii et al., Electrophysiological determinants of persistent dual atrioventricular nodal pathway physiology after slow pathway ablation in atrioventricular nodal reentrant tachycardia, PACE, 23(11), 2000, pp. 1916-1920
Authors:
Uchida, F
Kasai, A
Omichi, C
Fujii, E
Teramura, S
Nakano, T
Citation: F. Uchida et al., Shortening of conduction time over arborized atrioventricular accessory pathway with Mahaim fibers physiology just before interruption during radiofrequency ablation, JPN CIRC J, 64(2), 2000, pp. 151-155
Authors:
Matsui, M
Uchida, F
Tokunaga, T
Enomoto, H
Umezawa, T
Citation: M. Matsui et al., Low-energy ion-scattering spectroscopic analysis of structural damage in Si substrate under ultrathin SiO2 after gate etching, JPN J A P 1, 38(4A), 1999, pp. 2124-2130
Authors:
Matsui, M
Uchida, F
Katsuyama, K
Tokunaga, T
Kojima, M
Citation: M. Matsui et al., Using Auger electron spectroscopy for chemical analysis of plasma damage induced by reactive ion etching of SiO2, JPN J A P 1, 37(11), 1998, pp. 6199-6203