Authors: Haider, M Uhlemann, S Zach, J

Citation: M. Haider et al., Upper limits for the residual aberrations of a high-resolution aberration-corrected STEM, ULTRAMICROS, 81(3-4), 2000, pp. 163-175

Authors: Haider, M Uhlemann, S Kabius, B

Citation: M. Haider et al., Towards sub-angstrom ngstrom resolution by correction of spherical aberration, SCANNING, 21(2), 1999, pp. 89-90