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Results:
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Results: 1
Optical and electrical characterization of SiGe layers for vertical sub-100 nm MOS transistors
Authors:
Zhang, XH Unelind, P Kleverman, M Olajos, J
Citation:
Xh. Zhang et al., Optical and electrical characterization of SiGe layers for vertical sub-100 nm MOS transistors, THIN SOL FI, 336(1-2), 1998, pp. 323-325
Risultati:
1-1
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