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Results:
1-5
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Results: 5
Rapid generation of functional tests using MSCs, SDL and TTCN
Authors:
Probert, RL Ural, H Williams, AW
Citation:
Rl. Probert et al., Rapid generation of functional tests using MSCs, SDL and TTCN, COMPUT COMM, 24(3-4), 2001, pp. 374-393
A test sequence selection method for statecharts
Authors:
Hong, HS Kim, YG Cha, SD Bae, DH Ural, H
Citation:
Hs. Hong et al., A test sequence selection method for statecharts, SOFTW TEST, 10(4), 2000, pp. 203-227
Test generation based on control and data dependencies within system specifications in SDL
Authors:
Ural, H Saleh, K Williams, A
Citation:
H. Ural et al., Test generation based on control and data dependencies within system specifications in SDL, COMPUT COMM, 23(7), 2000, pp. 609-627
Submodule construction from concurrent system specifications
Authors:
Haghverdi, E Ural, H
Citation:
E. Haghverdi et H. Ural, Submodule construction from concurrent system specifications, INF SOFTW T, 41(8), 1999, pp. 499-506
Efficient checking sequences for testing finite state machines
Authors:
Inan, K Ural, H
Citation:
K. Inan et H. Ural, Efficient checking sequences for testing finite state machines, INF SOFTW T, 41(11-12), 1999, pp. 799-812
Risultati:
1-5
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