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Results: 1-9 |
Results: 9

Authors: VANCHINATHAN S KRISHNAGOPALAN GA
Citation: S. Vanchinathan et Ga. Krishnagopalan, DYNAMIC MODELING OF KRAFT PULPING OF SOUTHERN PINE BASED ON ONLINE LIQUOR ANALYSIS, Tappi journal, 80(3), 1997, pp. 123-133

Authors: BHAT RV VASANTHI S RAO BS RAO NR RAO VS NAGARAJA KV BAI RG PRASAD CAK VANCHINATHAN S ROY R SAHA S MUKHERJEE A GHOSH PK TOTEJA GS SAXENA BN
Citation: Rv. Bhat et al., AFLATOXIN B-1 CONTAMINATION IN MAIZE SAMPLES COLLECTED FROM DIFFERENTGEOGRAPHICAL REGIONS OF INDIA - A MULTICENTER STUDY, Food additives and contaminants, 14(2), 1997, pp. 151-156

Authors: VANCHINATHAN S ANANTH S JARVIS JM KRISHNAGOPALAN GA
Citation: S. Vanchinathan et al., KRAFT-LIQUOR ALKALI ANALYSIS USING NEAR-INFRARED SPECTROSCOPY, Tappi journal, 79(10), 1996, pp. 187-191

Authors: BHAT RV VASANTHI S RAO BS RAO RN RAO VS NAGARAJA KV BAI RG PRASAD CAK VANCHINATHAN S ROY R SAHA S MUKHERJEE A GHOSH PK TOTEJA GS SAXENA BN
Citation: Rv. Bhat et al., AFLATOXIN B-1 CONTAMINATION IN GROUNDNUT SAMPLES COLLECTED FROM DIFFERENT GEOGRAPHICAL REGIONS OF INDIA - A MULTICENTER STUDY, Food additives and contaminants, 13(3), 1996, pp. 325-331

Authors: DUMIN DJ MADDUX JR SUBRAMONIAM R SCOTT RS VANCHINATHAN S DUMIN NA DICKERSON KJ MOPURI S GLADSTONE SM HUGHES TW
Citation: Dj. Dumin et al., CHARACTERIZING WEAROUT, BREAKDOWN, AND TRAP GENERATION IN THIN SILICON-OXIDE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(4), 1995, pp. 1780-1787

Authors: VANCHINATHAN S KRISHNAGOPALAN GA
Citation: S. Vanchinathan et Ga. Krishnagopalan, KRAFT DELIGNIFICATION KINETICS BASED ON LIQUOR ANALYSIS, Tappi journal, 78(3), 1995, pp. 127-132

Authors: DUMIN DJ MOPURI SK VANCHINATHAN S SCOTT RS SUBRAMONIAM R LEWIS TG
Citation: Dj. Dumin et al., HIGH-FIELD RELATED THIN OXIDE WEAROUT AND BREAKDOWN, I.E.E.E. transactions on electron devices, 42(4), 1995, pp. 760-772

Authors: DUMIN DJ VANCHINATHAN S MOPURI S SUBRAMONIAM R
Citation: Dj. Dumin et al., EVIDENCE FOR NONUNIFORM TRAP DISTRIBUTIONS IN THIN OXIDES AFTER HIGH-VOLTAGE STRESSING, Journal of the Electrochemical Society, 142(6), 1995, pp. 2055-2059

Authors: DUMIN DJ VANCHINATHAN S
Citation: Dj. Dumin et S. Vanchinathan, BIPOLAR STRESSING, BREAKDOWN, AND TRAP GENERATION IN THIN SILICON-OXIDES, I.E.E.E. transactions on electron devices, 41(6), 1994, pp. 936-940
Risultati: 1-9 |