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Results:
1-7
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Results: 7
Authors:
VANDAMME EP
DEWOLF I
LAUWERS A
VANDAMME LKJ
Citation: Ep. Vandamme et al., LOW-FREQUENCY NOISE-ANALYSIS AS A DIAGNOSTIC-TOOL TO ASSESS THE QUALITY OF 0.25-MU-M TI-SILICIDED POLY LINES, Microelectronics and reliability, 38(6-8), 1998, pp. 925-929
Authors:
VANDAMME EP
JANSEN P
DEFERM L
Citation: Ep. Vandamme et al., MODELING THE SUBTHRESHOLD SWING IN MOSFETS, IEEE electron device letters, 18(8), 1997, pp. 369-371
Authors:
VANDAMME LKJ
VANDAMME EP
DOBBELSTEEN JJ
Citation: Lkj. Vandamme et al., IMPACT OF SILICON SUBSTRATE, IRON CONTAMINATION AND PERIMETER ON SATURATION CURRENT AND NOISE IN N(+)P DIODES, Solid-state electronics, 41(6), 1997, pp. 901-908
Authors:
VANDAMME EP
VANDAMME LKJ
Citation: Ep. Vandamme et Lkj. Vandamme, DIAGNOSTICS OF THE QUALITY OF MOSFETS, Microelectronics and reliability, 36(7-8), 1996, pp. 1107-1112
Authors:
VANDAMME EP
VANDAMME LKJ
CLAEYS C
SIMOEN E
SCHREUTELKAMP RJ
Citation: Ep. Vandamme et al., IMPACT OF SILICIDATION ON THE EXCESS NOISE BEHAVIOR OF MOS-TRANSISTORS, Solid-state electronics, 38(11), 1995, pp. 1893-1897
Authors:
VANDAMME EP
ANDAMME LKJ
Citation: Ep. Vandamme et Lkj. Andamme, 1 F NOISE AND ITS COHERENCE AS A DIAGNOSTIC-TOOL FOR QUALITY ASSESSMENT OF POTENTIOMETERS/, IEEE transactions on components, packaging, and manufacturing technology. Part A, 17(3), 1994, pp. 436-445
Authors:
LI XS
BARROS C
VANDAMME EP
VANDAMME LKJ
Citation: Xs. Li et al., PARAMETER EXTRACTION AND 1 F NOISE IN A SURFACE AND A BULK-TYPE, P-CHANNEL LDD MOSFET/, Solid-state electronics, 37(11), 1994, pp. 1853-1862
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