Authors: VANDAMME LKJ VANKEMENADE AJ

Citation: Lkj. Vandamme et Aj. Vankemenade, RESISTANCE NOISE MEASUREMENT - A BETTER DIAGNOSTIC-TOOL TO DETECT STRESS AND CURRENT-INDUCED DEGRADATION, Microelectronics and reliability, 37(1), 1997, pp. 87-93

Authors: VANKEMENADE AJ HERVE P VANDAMME LKJ

Citation: Aj. Vankemenade et al., 1 F NOISE IN THE EXTINCTION COEFFICIENT OF AN OPTICAL-FIBER/, Electronics Letters, 30(16), 1994, pp. 1338-1339