Authors: OCONNOR BH VANRIESSEN A CARTER J BURTON GR COOKSON DJ GARRETT RF

Citation: Bh. Oconnor et al., CHARACTERIZATION OF CERAMIC MATERIALS WITH BIGDIFF - A SYNCHROTRON-RADIATION DEBYE-SCHERRER POWDER DIFFRACTOMETER, Journal of the American Ceramic Society, 80(6), 1997, pp. 1373-1381

Authors: VANRIESSEN A WINTON GH OHYI H YOSHIDA M

Citation: A. Vanriessen et al., AN ANALYSIS OF SEM TECHNIQUES USED TO PROFILE CHEMICAL ETCHING ON THESEMICONDUCTOR HG1-XCDXTE, Micron, 25(6), 1994, pp. 511-517

Authors: VANRIESSEN A OCONNOR BH

Citation: A. Vanriessen et Bh. Oconnor, ASSESSMENT OF RESIDUAL STRAIN IN ZIRCONIA-TOUGHENED ALUMINA USING NEUTRON-DIFFRACTION, Journal of the American Ceramic Society, 76(8), 1993, pp. 2133-2135