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Results:
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Results: 2
EFFECT OF RUOX BOTTOM ELECTRODE ANNEALING TEMPERATURE ON SOL-GEL DERIVED PZT CAPACITORS
Authors:
RAWN CJ ORR MN VOGT RN BIRNIE DP SCHRIMPF RD
Citation:
Cj. Rawn et al., EFFECT OF RUOX BOTTOM ELECTRODE ANNEALING TEMPERATURE ON SOL-GEL DERIVED PZT CAPACITORS, Integrated ferroelectrics, 10(1-4), 1995, pp. 309-318
COATING UNIFORMITY AND DEVICE APPLICABILITY OF SPIN-COATED SOL-GEL PZT FILMS
Authors:
BIRNIE DP VOGT RN ORR MN SCHIFKO JR
Citation:
Dp. Birnie et al., COATING UNIFORMITY AND DEVICE APPLICABILITY OF SPIN-COATED SOL-GEL PZT FILMS, Microelectronic engineering, 29(1-4), 1995, pp. 189-192
Risultati:
1-2
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