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GROWTH-CONTROL AND PROPERTIES OF MICROCRYSTALLIZED SILICON FILMS DEPOSITED BY HYDROGEN PLASMA SPUTTERING
Authors: ACHIQ A RIZK R MADELON R GOURBILLEAU F VOIVENEL P
Citation: A. Achiq et al., GROWTH-CONTROL AND PROPERTIES OF MICROCRYSTALLIZED SILICON FILMS DEPOSITED BY HYDROGEN PLASMA SPUTTERING, Thin solid films, 296(1-2), 1997, pp. 15-18
A COMPARATIVE-STUDY OF THE EBIC CONTRAST AND GETTERING EFFICIENCY OF THE TILT BOUNDARIES SIGMA=25, SIGMA=13 AND SIGMA=9 IN SILICON BICRYSTALS
Authors: IHLAL A RIZK R VOIVENEL P NOUET G
Citation: A. Ihlal et al., A COMPARATIVE-STUDY OF THE EBIC CONTRAST AND GETTERING EFFICIENCY OF THE TILT BOUNDARIES SIGMA=25, SIGMA=13 AND SIGMA=9 IN SILICON BICRYSTALS, Journal de physique. III, 5(9), 1995, pp. 1371-1382
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