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Results: 1-10 |
Results: 10
THE MATERIALS MICROCHARACTERIZATION COLLA BORATORY - MORE THAN JUST REMOTE INSTRUMENT CONTROL
Authors: VOLKL E ALLARD LF
Citation: E. Volkl et Lf. Allard, THE MATERIALS MICROCHARACTERIZATION COLLA BORATORY - MORE THAN JUST REMOTE INSTRUMENT CONTROL, European journal of cell biology, 74, 1997, pp. 133-133
BERING AND CHIRIKOV - THE AMERICAN VOYAGE S AND THEIR IMPACT - FROST,OW
Authors: VOLKL E
Citation: E. Volkl, BERING AND CHIRIKOV - THE AMERICAN VOYAGE S AND THEIR IMPACT - FROST,OW, Jahrbucher fur Geschichte Osteuropas, 45(1), 1997, pp. 169-169
MORPHOLOGY AND CRYSTALLOGRAPHY OF NANOPARTICULATES REVEALED BY ELECTRON HOLOGRAPHY
Authors: ALLARD LF VOLKL E CARIM A DATYE AK RUOFF R
Citation: Lf. Allard et al., MORPHOLOGY AND CRYSTALLOGRAPHY OF NANOPARTICULATES REVEALED BY ELECTRON HOLOGRAPHY, Nanostructured materials, 7(1-2), 1996, pp. 137-146
GUIDE TO DOCUMENTS AND MANUSCRIPTS IN GRE AT-BRITAIN RELATING TO THE KINGDOM-OF-HUNGARY FROM THE EARLIEST TIMES TO 1800 - KURUCZ,G
Authors: VOLKL E
Citation: E. Volkl, GUIDE TO DOCUMENTS AND MANUSCRIPTS IN GRE AT-BRITAIN RELATING TO THE KINGDOM-OF-HUNGARY FROM THE EARLIEST TIMES TO 1800 - KURUCZ,G, Jahrbucher fur Geschichte Osteuropas, 44(4), 1996, pp. 632-632
ADVANCED ELECTRON HOLOGRAPHY - A NEW ALGORITHM FOR IMAGE-PROCESSING AND A STANDARDIZED QUALITY TEST FOR THE FEG ELECTRON-MICROSCOPE
Authors: VOLKL E ALLARD LF DATYE A FROST B
Citation: E. Volkl et al., ADVANCED ELECTRON HOLOGRAPHY - A NEW ALGORITHM FOR IMAGE-PROCESSING AND A STANDARDIZED QUALITY TEST FOR THE FEG ELECTRON-MICROSCOPE, Ultramicroscopy, 58(1), 1995, pp. 97-103
A SOFTWARE PACKAGE FOR THE PROCESSING AND RECONSTRUCTION OF ELECTRON HOLOGRAMS
Authors: VOLKL E ALLARD LF FROST B
Citation: E. Volkl et al., A SOFTWARE PACKAGE FOR THE PROCESSING AND RECONSTRUCTION OF ELECTRON HOLOGRAMS, Journal of Microscopy, 180, 1995, pp. 39-50
DENSITY CORRECTION OF PHOTOGRAPHIC MATERIAL FOR FURTHER IMAGE-PROCESSING IN ELECTRON-MICROSCOPY
Authors: VOLKL E LENZ F FU Q LICHTE H
Citation: E. Volkl et al., DENSITY CORRECTION OF PHOTOGRAPHIC MATERIAL FOR FURTHER IMAGE-PROCESSING IN ELECTRON-MICROSCOPY, Ultramicroscopy, 55(1), 1994, pp. 75-89
RECONSTRUCTION OF ELECTRON OFF-AXIS HOLOGRAMS - A NEW AND FAST ALTERNATIVE METHOD
Authors: LEHMANN M VOLKL E LENZ F
Citation: M. Lehmann et al., RECONSTRUCTION OF ELECTRON OFF-AXIS HOLOGRAMS - A NEW AND FAST ALTERNATIVE METHOD, Ultramicroscopy, 54(2-4), 1994, pp. 335-344
COMBINATION OF HIGH-RESOLUTION ELECTRON IMAGING AND HOLOGRAPHY IN THEINVESTIGATION OF THE MODULATED STRUCTURE OF ZR4ON3F5 (VOL 53, PG 53, 1994)
Authors: SCHWEDA E STRAHLE J LICHTE H VOLKL E
Citation: E. Schweda et al., COMBINATION OF HIGH-RESOLUTION ELECTRON IMAGING AND HOLOGRAPHY IN THEINVESTIGATION OF THE MODULATED STRUCTURE OF ZR4ON3F5 (VOL 53, PG 53, 1994), Ultramicroscopy, 54(1), 1994, pp. 94-95
COMBINATION OF HIGH-RESOLUTION ELECTRON IMAGING AND HOLOGRAPHY IN THEINVESTIGATION OF THE MODULATED STRUCTURE OF ZR4ON3F5
Authors: SCHWEDA E STRAHLE J LICHTE H VOLKL E
Citation: E. Schweda et al., COMBINATION OF HIGH-RESOLUTION ELECTRON IMAGING AND HOLOGRAPHY IN THEINVESTIGATION OF THE MODULATED STRUCTURE OF ZR4ON3F5, Ultramicroscopy, 53(1), 1994, pp. 53-62
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