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Results: 1-11 |
Results: 11
Immobilizing Au nanoparticles on SiO2 surfaces using octadecylsiloxane monolayers
Authors: Resch, R Meltzer, S Vallant, T Hoffmann, H Koel, BE Madhukar, A Requicha, AAG Will, P
Citation: R. Resch et al., Immobilizing Au nanoparticles on SiO2 surfaces using octadecylsiloxane monolayers, LANGMUIR, 17(18), 2001, pp. 5666-5670
Analytical evaluation of tapping mode atomic force microscopy for chemicalimaging of surfaces
Authors: Basnar, B Friedbacher, G Brunner, H Vallant, T Mayer, U Hoffmann, H
Citation: B. Basnar et al., Analytical evaluation of tapping mode atomic force microscopy for chemicalimaging of surfaces, APPL SURF S, 171(3-4), 2001, pp. 213-225
Monolayer-controlled deposition of silicon oxide films on gold, silicon, and mica substrates by room-temperature adsorption and oxidation of alkylsiloxane monolayers
Authors: Vallant, T Brunner, H Kattner, J Mayer, U Hoffmann, H Leitner, T Friedbacher, G Schugerl, G Svagera, R Ebel, M
Citation: T. Vallant et al., Monolayer-controlled deposition of silicon oxide films on gold, silicon, and mica substrates by room-temperature adsorption and oxidation of alkylsiloxane monolayers, J PHYS CH B, 104(22), 2000, pp. 5309-5317
Fabrication of nanostructured surfaces using self-assembled monolayers
Authors: Basnar, B Madera, M Friedbacher, G Vallant, T Mayer, U Hoffmann, H
Citation: B. Basnar et al., Fabrication of nanostructured surfaces using self-assembled monolayers, MIKROCH ACT, 133(1-4), 2000, pp. 325-329
Investigations of the growth of self-assembled octadecylsiloxane monolayers with atomic force microscopy
Authors: Leitner, T Friedbacher, G Vallant, T Brunner, H Mayer, U Hoffmann, H
Citation: T. Leitner et al., Investigations of the growth of self-assembled octadecylsiloxane monolayers with atomic force microscopy, MIKROCH ACT, 133(1-4), 2000, pp. 331-336
Substrate effects on the formation of alkylsiloxane monolayers
Authors: Brunner, H Vallant, T Mayer, U Hoffmann, H Basnar, B Vallant, M Friedbacher, G
Citation: H. Brunner et al., Substrate effects on the formation of alkylsiloxane monolayers, LANGMUIR, 15(6), 1999, pp. 1899-1901
Investigation of the formation and structure of self-assembled alkylsiloxane monolayers on silicon using in situ attenuated total reflection infraredspectroscopy
Authors: Vallant, T Kattner, J Brunner, H Mayer, U Hoffmann, H
Citation: T. Vallant et al., Investigation of the formation and structure of self-assembled alkylsiloxane monolayers on silicon using in situ attenuated total reflection infraredspectroscopy, LANGMUIR, 15(16), 1999, pp. 5339-5346
Comparing reactivities of metal complexes in solution and on surfaces by IR spectroscopy and time-resolved in situ ellipsometry
Authors: Vallant, T Simanko, W Brunner, H Mayer, U Hoffmann, H Schmid, R Kirchner, K Svagera, R Schugerl, G Ebel, M
Citation: T. Vallant et al., Comparing reactivities of metal complexes in solution and on surfaces by IR spectroscopy and time-resolved in situ ellipsometry, ORGANOMETAL, 18(18), 1999, pp. 3744-3749
In situ and ex situ AFM investigation of the formation of octadecylsiloxane monolayers
Authors: Resch, R Grasserbauer, M Friedbacher, G Vallant, T Brunner, H Mayer, U Hoffmann, H
Citation: R. Resch et al., In situ and ex situ AFM investigation of the formation of octadecylsiloxane monolayers, APPL SURF S, 140(1-2), 1999, pp. 168-175
Polymers at interfaces: Using atom transfer radical polymerization in the controlled growth of homopolymers and block copolymers from silicon surfaces in the absence of untethered sacrificial initiator
Authors: Matyjaszewski, K Miller, PJ Shukla, N Immaraporn, B Gelman, A Luokala, BB Siclovan, TM Kickelbick, G Vallant, T Hoffmann, H Pakula, T
Citation: K. Matyjaszewski et al., Polymers at interfaces: Using atom transfer radical polymerization in the controlled growth of homopolymers and block copolymers from silicon surfaces in the absence of untethered sacrificial initiator, MACROMOLEC, 32(26), 1999, pp. 8716-8724
Formation of ultrathin films at the solid-liquid interface studied by in situ ellipsometry
Authors: Brunner, H Vallant, T Mayer, U Hoffmann, H
Citation: H. Brunner et al., Formation of ultrathin films at the solid-liquid interface studied by in situ ellipsometry, J COLL I SC, 212(2), 1999, pp. 545-552
Risultati: 1-11 |