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Results:
1-3
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Results: 3
Time-resolved optical characterization of electrical activity in integrated circuits
Authors:
Tsang, JC Kash, JA Vallett, DP
Citation:
Jc. Tsang et al., Time-resolved optical characterization of electrical activity in integrated circuits, P IEEE, 88(9), 2000, pp. 1440-1459
Picosecond imaging circuit analysis
Authors:
Tsang, JC Kash, JA Vallett, DP
Citation:
Jc. Tsang et al., Picosecond imaging circuit analysis, IBM J RES, 44(4), 2000, pp. 583-603
FA future requirements
Authors:
Vallett, DP
Citation:
Dp. Vallett, FA future requirements, FAILURE ANALYSIS OF INTEGRATED CIRCUITS, 1999, pp. 241-250
Risultati:
1-3
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