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Montesin, T
Valot, C
Favergeon, J
Bertrand, G
Vadon, A
Citation: I. Salles-desvignes et al., Near-coincidence lattice method for the determination of epitaxy strains during oxidation of metals, ACT MATER, 48(7), 2000, pp. 1505-1515
Citation: M. Dormeval et al., X ray diffraction investigation of Pu-Ce and Pu-Ce-Ga alloys stabilized inthe delta-phase, J PHYS IV, 10(P10), 2000, pp. 425-433
Authors:
Petigny, N
Barberis, P
Lemaignan, C
Valot, C
Lallemant, M
Citation: N. Petigny et al., In situ XRD analysis of the oxide layers formed by oxidation at 743 K on Zircaloy 4 and Zr-1NbO, J NUCL MAT, 280(3), 2000, pp. 318-330
Citation: N. Floquet et C. Valot, Ferroelectric domain walls in BaTiO3: Structural wall model interpreting fingerprints in XRPD diagrams, FERROELECTR, 234(1-4), 1999, pp. 107-122