Authors: Vanalme, GM Goubert, L Van Meirhaeghe, RL Cardon, F Van Daele, P

Citation: Gm. Vanalme et al., A ballistic electron emission microscopy study of barrier height inhomogeneities introduced in Au/III-V semiconductor Schottky barrier contacts by chemical pretreatments, SEMIC SCI T, 14(9), 1999, pp. 871-877