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Results:
1-2
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Results: 2
Single event upset tests of an 80-Mb/s optical receiver
Authors:
Faccio, F Berger, G Gill, K Huhtinen, M Marchioro, A Moreira, P Vasey, F
Citation:
F. Faccio et al., Single event upset tests of an 80-Mb/s optical receiver, IEEE NUCL S, 48(5), 2001, pp. 1700-1707
Ageing tests of radiation damaged lasers and photodiodes for the CMS experiment at CERN
Authors:
Gill, K Azevedo, C Batten, J Cervelli, G Grabit, R Jensen, F Troska, J Vasey, F
Citation:
K. Gill et al., Ageing tests of radiation damaged lasers and photodiodes for the CMS experiment at CERN, IEEE NUCL S, 47(3), 2000, pp. 667-674
Risultati:
1-2
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