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Results: 1-8 |
Results: 8

Authors: Levin, I Robins, LH Vaudin, MD Tuchman, JA Lakin, E Sherman, MJ Ramer, J
Citation: I. Levin et al., Spontaneous compositional modulation in the AlGaN layers of a thick AlGaN/GaN multilayer structure, J APPL PHYS, 89(1), 2001, pp. 188-193

Authors: Yang, HQ Al-Brithen, H Smith, AR Borchers, JA Cappelletti, RL Vaudin, MD
Citation: Hq. Yang et al., Structural and magnetic properties of eta-phase manganese nitride films grown by molecular-beam epitaxy, APPL PHYS L, 78(24), 2001, pp. 3860-3862

Authors: Rotter, LD Vaudin, MD Bonevich, JE Kaiser, DL Park, SO
Citation: Ld. Rotter et al., Correlation of the optical gap of (Ba,Sr)(y)TiO2+y thin films with film composition, THIN SOL FI, 368(1), 2000, pp. 41-48

Authors: Seabaugh, MM Vaudin, MD Cline, JP Messing, GL
Citation: Mm. Seabaugh et al., Comparison of texture analysis techniques for highly oriented alpha-Al2O3, J AM CERAM, 83(8), 2000, pp. 2049-2054

Authors: Seabaugh, MM Messing, GL Vaudin, MD
Citation: Mm. Seabaugh et al., Texture development and microstructure evolution in liquid-phase-sintered alpha-alumina ceramics prepared by templated grain growth, J AM CERAM, 83(12), 2000, pp. 3109-3116

Authors: Kaiser, DL Vaudin, MD Rotter, LD Bonevich, JE Levin, I Armstrong, JT Roytburd, AL Schlom, DG
Citation: Dl. Kaiser et al., Effect of film composition on the orientation of (Ba,Sr)TiO3 grains in (Ba,Sr)(y)TiO2+y thin films, J MATER RES, 14(12), 1999, pp. 4657-4666

Authors: Alpay, SP Nagarajan, V Bendersky, LA Vaudin, MD Aggarwal, S Ramesh, R Roytburd, AL
Citation: Sp. Alpay et al., Effect of the electrode layer on the polydomain structure of epitaxial PbZr0.2Ti0.8O3 thin films, J APPL PHYS, 85(6), 1999, pp. 3271-3277

Authors: Blendell, JE Vaudin, MD Fuller, ER
Citation: Je. Blendell et al., Determination of texture from individual grain orientation measurements, J AM CERAM, 82(11), 1999, pp. 3217-3220
Risultati: 1-8 |