Authors:
Nielsen, M
Feidenhans'l, R
Howes, PB
Vedde, J
Rasmussen, K
Benamara, M
Grey, F
Citation: M. Nielsen et al., The interface structure in directly bonded silicon crystals studied by synchrotron X-ray diffraction, SURF SCI, 442(1), 1999, pp. L989-L994