Authors: Velterop, L Delhez, R de Keijser, TH Mittemeijer, EJ Reefman, D

Citation: L. Velterop et al., X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: arevision and allowance for texture and non-uniform fault probabilities, J APPL CRYS, 33, 2000, pp. 296-306