Authors:
Morin, M
Verreault, S
Mailloux, A
Frechette, J
Chatigny, S
Painchaud, Y
Beaudry, P
Citation: M. Morin et al., Inclusion characterization in a scattering slab with time-resolved transmittance measurements: perturbation analysis, APPL OPTICS, 39(16), 2000, pp. 2840-2852