Authors: Taravella, MJ Viega, J Luiszer, F Drexler, J Blackburn, P Hovland, P Repine, JE

Citation: Mj. Taravella et al., Respirable particles in the excimer laser plume, J CAT REF S, 27(4), 2001, pp. 604-607

Authors: Viega, J Kohno, T Potter, B

Citation: J. Viega et al., Trust (and mistrust) in secure applications, COMM ACM, 44(2), 2001, pp. 31-36

Authors: Viega, J Voas, J

Citation: J. Viega et J. Voas, Quality time - Can aspect-oriented programming lead to more reliable software?, IEEE SOFTW, 17(6), 2000, pp. 19-21

Authors: Viega, J McGraw, G Mutdosch, T Felten, EW

Citation: J. Viega et al., Statically scanning Java Code: Finding security vulnerabilities, IEEE SOFTW, 17(5), 2000, pp. 68

Authors: Alexander, RT Bieman, JM Viega, J

Citation: Rt. Alexander et al., We shape our tools and our tools shape us - Reply, COMPUTER, 33(7), 2000, pp. 4-5

Authors: Alexander, RT Bieman, JM Viega, J

Citation: Rt. Alexander et al., Coping with Java programming stress, COMPUTER, 33(4), 2000, pp. 30