Authors: Rath, S Grigorescu, C Hsieh, ML Voudouris, E Stradling, RA

Citation: S. Rath et al., Polarization-dependent Raman spectroscopic protocols for calibration of the alloy composition and strain in bulk and thin-film Si1-xGex, SEMIC SCI T, 15(2), 2000, pp. L1-L5