Citation: Dg. Wardell et al., RUN-LENGTH DISTRIBUTIONS OF SPECIAL-CAUSE CONTROL CHARTS FOR CORRELATED PROCESSES - REJOINDER, Technometrics, 36(1), 1994, pp. 23-27
Citation: Dg. Wardell et al., RUN-LENGTH DISTRIBUTIONS OF RESIDUAL CONTROL CHARTS FOR AUTOCORRELATED PROCESSES, Journal of quality technology, 26(4), 1994, pp. 308-317