Authors: HASENKOX U MITZE C WASER RM

Citation: U. Hasenkox et al., A NOVEL PROPIONATE-BASED CHEMICAL SOLUTION DEPOSITION METHOD OF LA1-X(CA, SR)(X)MNO3 THIN-FILMS FOR MICROELECTRONICS APPLICATIONS, Integrated ferroelectrics, 18(1-4), 1997, pp. 339-350

Authors: HOFFMANN S WASER RM

Citation: S. Hoffmann et Rm. Waser, DIELECTRIC-PROPERTIES, LEAKAGE BEHAVIOR, AND RESISTANCE DEGRADATION OF THIN-FILMS OF THE SOLID-SOLUTION SERIES BA(TI1-YZRY)O-3, Integrated ferroelectrics, 17(1-4), 1997, pp. 141-152

Authors: WASER RM

Citation: Rm. Waser, MICROSTRUCTURE OF CERAMIC THIN-FILMS, Current opinion in solid state & materials science, 1(5), 1996, pp. 706-714

Authors: WARREN WL DIMOS D WASER RM

Citation: Wl. Warren et al., DEGRADATION MECHANISMS IN FERROELECTRIC AND HIGH-PERMITTIVITY PEROVSKITES, MRS bulletin, 21(7), 1996, pp. 40-45