Authors: HOPFE S KALLIS N MAI H POMPE W SCHOLZ R VOLLMAR S WEHNER B WEISSBROT P

Citation: S. Hopfe et al., CHARACTERIZATION OF MULTILAYER-INTERFACES BY X-RAY-DIFFRACTION, TEM, SNMS AND AES, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 14-22