Authors: WELNAK J DONG Z SOLAK H WALLACE J CERRINA F BERTOLO M BIANCO A DIFONZO S FONTANA S JARK W MAZZOLINI F ROSEI R SAVOIA A UNDERWOOD JH MARGARITONDO G

Citation: J. Welnak et al., SUPERMAXIMUM - A SCHWARZSCHILD-BASED, SPECTROMICROSCOPE FOR ELETTRA, Review of scientific instruments, 66(2), 1995, pp. 2273-2276

Authors: CHEN G YAMAZAKI K WALDO W WELNAK J WELLS GM CERRINA F

Citation: G. Chen et al., SYNCHROTRON-RADIATION X-RAY-LITHOGRAPHY BEAMLINE OPTICS ALIGNMENT USING THE HARTMANN METHOD, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 4013-4017

Authors: WELNAK J RAYCHAUDHURI AK NG W CERRINA F

Citation: J. Welnak et al., DOUBLE-MOMENT KIRKPATRICK-BAEZ CONDENSING MIRRORS - IN-SITU ALIGNMENT, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 347(1-3), 1994, pp. 372-375

Authors: NG W RAYCHAUDHURI AK LIANG S SINGH S SOLAK H WELNAK J CERRINA F MARGARITONDO G UNDERWOOD JH KORTRIGHT JB PERERA RCC

Citation: W. Ng et al., HIGH-RESOLUTION SPECTROMICROSCOPY WITH MAXIMUM - PHOTOEMISSION SPECTROSCOPY REACHES THE 1000-ANGSTROM SCALE, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 347(1-3), 1994, pp. 422-430