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Results:
1-14
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Results: 14
Authors:
STENZEL O
STENDAL A
RODER M
WILBRANDT S
DREWS D
WERNINGHAUS T
VONBORCZYSKOWSKI C
ZAHN DRT
Citation: O. Stenzel et al., LOCALIZED PLASMON EXCITATION IN METAL NANOCLUSTERS AS A TOOL TO STUDYTHICKNESS-DEPENDENT OPTICAL-PROPERTIES OF COPPER PHTHALOCYANINE ULTRATHIN FILMS, Nanotechnology, 9(1), 1998, pp. 6-19
Authors:
WERNINGHAUS T
FRIEDRICH M
CIMALLA V
SCHEINER J
GOLDHAHN R
ZAHN DRT
PEZOLDT J
Citation: T. Werninghaus et al., OPTICAL CHARACTERIZATION OF MBE GROWN CUBIC AND HEXAGONAL SIC FILMS ON SI(111), DIAMOND AND RELATED MATERIALS, 7(9), 1998, pp. 1385-1389
Authors:
WERNINGHAUS T
ZAHN DRT
WANG EG
CHEN Y
Citation: T. Werninghaus et al., MICRO-RAMAN SPECTROSCOPY INVESTIGATION OF C3N4 CRYSTALS DEPOSITED ON NICKEL SUBSTRATES, DIAMOND AND RELATED MATERIALS, 7(1), 1998, pp. 52-56
Authors:
DREWS D
SCHNEIDER A
WERNINGHAUS T
BEHRES A
HEUKEN M
HEIME K
ZAHN DRT
Citation: D. Drews et al., CHARACTERIZATION OF MOVPE GROWN INPSB INAS HETEROSTRUCTURES/, Applied surface science, 123, 1998, pp. 746-750
Authors:
PARK S
HAN H
KAISER R
WERNINGHAUS T
SCHNEIDER A
DREWS D
ZAHN DRT
Citation: S. Park et al., THE PHOTOTRANSFORMATION OF C-60 THIN-FILMS ON GAAS(100) STUDIED BY IN-SITU RAMAN-SPECTROSCOPY, Journal of applied physics, 84(3), 1998, pp. 1340-1345
Authors:
WERNINGHAUS T
SCHNEIDER A
DREWS D
ZAHN DRT
Citation: T. Werninghaus et al., IDENTIFICATION OF ULTRA-THIN LAYERS BY CROSS-SECTIONAL RAMAN-SPECTROSCOPY, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 32-35
Authors:
SCHAARSCHMIDT G
MAINZ B
LAUFER S
WERNINGHAUS T
ZAHN DRT
HINNEBERG HJ
Citation: G. Schaarschmidt et al., DIAMOND GROWTH IN AND ABOVE TRENCHES IN SILICON, DIAMOND AND RELATED MATERIALS, 6(8), 1997, pp. 1019-1025
Authors:
WERNINGHAUS T
FRIEDRICH M
HAHN J
RICHTER F
ZAHN DRT
Citation: T. Werninghaus et al., RAMAN-SPECTROSCOPY INVESTIGATION OF CUBIC BORON-NITRIDE SINGLE-CRYSTALS AND LAYERS ON SI(100), DIAMOND AND RELATED MATERIALS, 6(5-7), 1997, pp. 612-616
Authors:
GOTTFRIED K
KRIZ J
WERNINGHAUS T
THUMER M
KAUFMANN C
ZAHN DRT
GESSNER T
Citation: K. Gottfried et al., FILM STRESS MEASUREMENTS FOR HIGH-TEMPERATURE MICROMECHANICAL AND MICROELECTRONICAL APPLICATIONS BASED ON SIC, Materials science & engineering. B, Solid-state materials for advanced technology, 46(1-3), 1997, pp. 171-175
Authors:
STENZEL O
STENDAL A
DREWS D
WERNINGHAUS T
FALKE M
ZAHN DRT
VONBORCZYSKOWSKI C
Citation: O. Stenzel et al., ENHANCED RAMAN SIGNALS IN THIN SOLID FILMS FORMED FROM FULLERENE, COPPERPHTHALOCYANINE, OR PERYLENE DERIVATES AND INCORPORATED METAL-CLUSTERS, Applied surface science, 108(1), 1997, pp. 71-87
Authors:
WERNINGHAUS T
HAHN J
RICHTER F
ZAHN DRT
Citation: T. Werninghaus et al., RAMAN-SPECTROSCOPY INVESTIGATION OF SIZE EFFECTS IN CUBIC BORON-NITRIDE, Applied physics letters, 70(8), 1997, pp. 958-960
DIAMOND LAYERS ON SILICON - FEASIBILITY OF INTERFACE ASSESSMENT BY INFRARED AND RAMAN SPECTROSCOPIES
Authors:
WERNINGHAUS T
FRIEDRICH M
ZAHN DRT
Citation: T. Werninghaus et al., DIAMOND LAYERS ON SILICON - FEASIBILITY OF INTERFACE ASSESSMENT BY INFRARED AND RAMAN SPECTROSCOPIES, Physica status solidi. a, Applied research, 154(1), 1996, pp. 269-282
Authors:
ROSSOW U
WERNINGHAUS T
ZHAN DRT
RICHTER W
HORN K
Citation: U. Rossow et al., THIN EPITAXIAL-FILMS OF WIDE-GAP II-VI COMPOUNDS STUDIED BY SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 233(1-2), 1993, pp. 176-179
Authors:
ROSSOW U
KROST A
WERNINGHAUS T
SCHATKE K
RICHTER W
HASE A
KUNZEL H
ROEHLE H
Citation: U. Rossow et al., ELLIPSOMETRIC CHARACTERIZATION OF INP-BASED QUANTUM-WELL STRUCTURES, Thin solid films, 233(1-2), 1993, pp. 180-184
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1-14
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