Authors: WESTRA KL THOMSON DJ

Citation: Kl. Westra et Dj. Thomson, EFFECT OF TIP SHAPE ON SURFACE-ROUGHNESS MEASUREMENTS FROM ATOMIC-FORCE MICROSCOPY IMAGES OF THIN-FILMS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(2), 1995, pp. 344-349

Authors: WESTRA KL THOMSON DJ

Citation: Kl. Westra et Dj. Thomson, THE MICROSTRUCTURE OF THIN-FILMS OBSERVED USING ATOMIC-FORCE MICROSCOPY, Thin solid films, 257(1), 1995, pp. 15-21

Authors: WESTRA KL THOMSON DJ

Citation: Kl. Westra et Dj. Thomson, ATOMIC-FORCE MICROSCOPE TIP RADIUS NEEDED FOR ACCURATE IMAGING OF THIN-FILM SURFACES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3176-3181

Authors: KONEVECKI MW WESTRA KL SULLIVAN BT KORNELSON KE BRETT MJ

Citation: Mw. Konevecki et al., OPTICAL-CONSTANTS OF REACTIVELY-SPUTTERED NBN FILMS, Thin solid films, 232(2), 1993, pp. 228-231

Authors: WESTRA KL MITCHELL AW THOMSON DJ

Citation: Kl. Westra et al., TIP ARTIFACTS IN ATOMIC-FORCE MICROSCOPE IMAGING OF THIN-FILM SURFACES, Journal of applied physics, 74(5), 1993, pp. 3608-3610