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Citation: J. Hesselbarth et al., 2 NEW 6-PORT REFLECTOMETERS COVERING VERY LARGE BANDWIDTHS, IEEE transactions on instrumentation and measurement, 46(4), 1997, pp. 966-969

Authors: WIEDMANN F HUYART B BERGEAULT E JALLET L

Citation: F. Wiedmann et al., NEW STRUCTURE FOR A 6-PORT REFLECTOMETER IN MONOLITHIC MICROWAVE INTEGRATED-CIRCUIT TECHNOLOGY, IEEE transactions on instrumentation and measurement, 46(2), 1997, pp. 527-530