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Results: 1-7 |
Results: 7
QUANTIFICATION OF METAL CONTAMINANTS ON GAAS WITH TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY
Authors: SCHRODEROEYNHAUSEN F BURKHARDT B FLADUNG T KOTTER F SCHNIEDERS A WIEDMANN L BENNINGHOVEN A
Citation: F. Schroderoeynhausen et al., QUANTIFICATION OF METAL CONTAMINANTS ON GAAS WITH TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(3), 1998, pp. 1002-1006
POETRY AND PASTRY MEMENTOS
Authors: WIEDMANN L MACHTAN D
Citation: L. Wiedmann et D. Machtan, POETRY AND PASTRY MEMENTOS, JOURNAL OF ADOLESCENT AND ADULT LITERACY, 39(5), 1996, pp. 399-401
ANALYSIS OF STOICHIOMETRY AND OXIDE-GROWTH OF HF TREATED GAAS(100) BYX-RAY PHOTOELECTRON-SPECTROSCOPY AND TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY
Authors: STORM W WOLANY D SCHRODER F BECKER G BURKHARDT B WIEDMANN L
Citation: W. Storm et al., ANALYSIS OF STOICHIOMETRY AND OXIDE-GROWTH OF HF TREATED GAAS(100) BYX-RAY PHOTOELECTRON-SPECTROSCOPY AND TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(1), 1994, pp. 147-153
COMBINED INSTRUMENT FOR THE ONLINE INVESTIGATION OF PLASMA-DEPOSITED OR ETCHED SURFACES BY MONOCHROMATIZED X-RAY PHOTOELECTRON-SPECTROSCOPYAND TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY
Authors: JAHN PW PETRAT FM WOLANY D DEIMEL M GANTENFORT T SCHMERLING C WENSING H WIEDMANN L BENNINGHOVEN A
Citation: Pw. Jahn et al., COMBINED INSTRUMENT FOR THE ONLINE INVESTIGATION OF PLASMA-DEPOSITED OR ETCHED SURFACES BY MONOCHROMATIZED X-RAY PHOTOELECTRON-SPECTROSCOPYAND TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(3), 1994, pp. 671-676
COMBINED DEPTH PROFILE ANALYSIS WITH SNMS, SIMS AND XPS - PREFERENTIAL SPUTTERING AND OXYGEN-TRANSPORT IN BINARY METAL-OXIDE MULTILAYER SYSTEMS
Authors: ALBERS T NEUMANN M LIPINSKY D WIEDMANN L BENNINGHOVEN A
Citation: T. Albers et al., COMBINED DEPTH PROFILE ANALYSIS WITH SNMS, SIMS AND XPS - PREFERENTIAL SPUTTERING AND OXYGEN-TRANSPORT IN BINARY METAL-OXIDE MULTILAYER SYSTEMS, Surface and interface analysis, 22(1-12), 1994, pp. 9-13
COMPARATIVE IN-SITU TOF-SIMS XPS STUDY OF POLYSTYRENE MODIFIED BY ARGON, OXYGEN AND NITROGEN PLASMAS/
Authors: PETRAT FM WOLANY D SCHWEDE BC WIEDMANN L BENNINGHOVEN A
Citation: Fm. Petrat et al., COMPARATIVE IN-SITU TOF-SIMS XPS STUDY OF POLYSTYRENE MODIFIED BY ARGON, OXYGEN AND NITROGEN PLASMAS/, Surface and interface analysis, 21(6-7), 1994, pp. 402-406
IN-SITU TOF-SIMS XPS INVESTIGATION OF NITROGEN PLASMA-MODIFIED POLYSTYRENE SURFACES
Authors: PETRAT FM WOLANY D SCHWEDE BC WIEDMANN L BENNINGHOVEN A
Citation: Fm. Petrat et al., IN-SITU TOF-SIMS XPS INVESTIGATION OF NITROGEN PLASMA-MODIFIED POLYSTYRENE SURFACES, Surface and interface analysis, 21(5), 1994, pp. 274-282
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