Authors: REIHS K VOETZ M KRUFT M WOLANY D BENNINGHOVEN A

Citation: K. Reihs et al., MOLECULAR-WEIGHT DETERMINATION OF BULK POLYMER SURFACES BY STATIC SECONDARY-ION MASS-SPECTROMETRY, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 93-95

Authors: STORM W WOLANY D SCHRODER F BECKER G BURKHARDT B WIEDMANN L

Citation: W. Storm et al., ANALYSIS OF STOICHIOMETRY AND OXIDE-GROWTH OF HF TREATED GAAS(100) BYX-RAY PHOTOELECTRON-SPECTROSCOPY AND TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(1), 1994, pp. 147-153

Authors: JAHN PW PETRAT FM WOLANY D DEIMEL M GANTENFORT T SCHMERLING C WENSING H WIEDMANN L BENNINGHOVEN A

Citation: Pw. Jahn et al., COMBINED INSTRUMENT FOR THE ONLINE INVESTIGATION OF PLASMA-DEPOSITED OR ETCHED SURFACES BY MONOCHROMATIZED X-RAY PHOTOELECTRON-SPECTROSCOPYAND TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(3), 1994, pp. 671-676

Authors: PETRAT FM WOLANY D SCHWEDE BC WIEDMANN L BENNINGHOVEN A

Citation: Fm. Petrat et al., COMPARATIVE IN-SITU TOF-SIMS XPS STUDY OF POLYSTYRENE MODIFIED BY ARGON, OXYGEN AND NITROGEN PLASMAS/, Surface and interface analysis, 21(6-7), 1994, pp. 402-406

Authors: PETRAT FM WOLANY D SCHWEDE BC WIEDMANN L BENNINGHOVEN A

Citation: Fm. Petrat et al., IN-SITU TOF-SIMS XPS INVESTIGATION OF NITROGEN PLASMA-MODIFIED POLYSTYRENE SURFACES, Surface and interface analysis, 21(5), 1994, pp. 274-282