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Results:
1-7
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Results: 7
Authors:
NICKEL NH
JACKSON WB
WU IW
TSAI CC
CHIANG A
Citation: Nh. Nickel et al., HYDROGEN PERMEATION THROUGH THIN SILICON-OXIDE FILMS, Physical review. B, Condensed matter, 52(11), 1995, pp. 7791-7794
Authors:
STURM JC
WU IW
HACK M
Citation: Jc. Sturm et al., LEAKAGE CURRENT MODELING OF SERIES-CONNECTED THIN-FILM TRANSISTORS, I.E.E.E. transactions on electron devices, 42(8), 1995, pp. 1561-1563
Authors:
DAVIS RJ
GAINER JL
ONEAL G
WU IW
Citation: Rj. Davis et al., PHOTOCATALYTIC DECOLORIZATION OF WASTE-WATER DYES, Water environment research, 66(1), 1994, pp. 50-53
Authors:
KING TJ
HACK MG
WU IW
Citation: Tj. King et al., EFFECTIVE DENSITY-OF-STATES DISTRIBUTIONS FOR ACCURATE MODELING OF POLYCRYSTALLINE-SILICON THIN-FILM TRANSISTORS, Journal of applied physics, 75(2), 1994, pp. 908-913
Authors:
SINCLAIR R
MORGIEL J
KIRTIKAR AS
WU IW
CHIANG A
Citation: R. Sinclair et al., DIRECT OBSERVATION OF CRYSTALLIZATION IN SILICON BY IN-SITU HIGH-RESOLUTION ELECTRON-MICROSCOPY, Ultramicroscopy, 51(1-4), 1993, pp. 41-45
Authors:
HACK M
LEWIS AG
WU IW
Citation: M. Hack et al., PHYSICAL MODELS FOR DEGRADATION EFFECTS IN POLYSILICON THIN-FILM TRANSISTORS, I.E.E.E. transactions on electron devices, 40(5), 1993, pp. 890-897
Authors:
HACK M
WU IW
LEWIS AG
KING TJ
Citation: M. Hack et al., NUMERICAL SIMULATIONS OF ON AND OFF STATE CHARACTERISTICS OF POLYSILICON THIN-FILM TRANSISTORS, I.E.E.E. transactions on electron devices, 40(11), 1993, pp. 2128-2128
Risultati:
1-7
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