Citation: J. Walczak et B. Majkusiak, The remote roughness mobility resulting from the ultrathin SiO2 thickness nonuniformity in the DG SOI and bulk MOS transistors, MICROEL ENG, 59(1-4), 2001, pp. 417-421
Authors:
Collier, J
Hernandez-Gomez, C
Ross, IN
Matousek, P
Danson, CN
Walczak, J
Citation: J. Collier et al., Evaluation of an ultrabroadband high-gain amplification technique for chirped pulse amplification facilities, APPL OPTICS, 38(36), 1999, pp. 7486-7493